| 描述: |
粗糙度测量探头 Hommel P 2FE 30 P2F E 100
Contour measuring device, contour measuring device, contourograph,
contourograph, roughness measuring device, roughness measurement,
roundness measurement
-Manufacturer: Hommel, probe for
roughness measuring device
-Probe: Type P2FE 30 / P2F E 100
-Individual components: see photos
-Dimensions box:
235/105/H30 mm
-Weight.: 0.4 kg
seller offer No. resale 30459
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