| 描述: |
粗糙度测试仪探头支架 Hommel KVA P2
Contour measuring device, contour measuring device, contourograph,
contourograph, roughness measuring device, roughness measurement,
roundness measurement, roughness probe
-Manufacturer:
Hommel, probe holder for roughness measuring device
-Type: KVA
type T64106 P2/115
-Tactile path: s= 12 mm
-Dimensions box:
345/130/H85 mm
-Weight: 1.7 kg
seller offer No. resale 30461
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